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Latest Product NewsNew Cryo EM resolution benchmark in Structural Biology set by scientists at UCSF
US Patent on TEM Wand technology Granted to XEI
Tecnai Arctica™ Cryo Transmission Electron Microscope for Structural Biology
JEOL Introduces New Sub-nm Field Emission SEM Series
Automatic Mapping with Bruker's CrystAlign EBSD
Micro-Computed Tomography Accessory for 2D and 3D X-ray Imaging on Scanning Electron Microscopes
Fast High Quality EDS with New Octane Series SDDs
New Hikari XP EBSD Camera from EDAX
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