QUANTAX – Precision Tools for Nano-scale Analysis
Bruker AXS Microanalysis has more than 40 years experience in the production of energy-dispersive spectrometers and detectors for X-ray microanalysis in electron microscopes. We have also pioneered the application of liquid nitrogen free silicon drifts detectors (SDDs) for this purpose. Bruker’s XFlash® SDDs have been commercially available for more than a decade.
The fifth generation of Bruker SDDs – the current XFlash® 5000 series consists of 3 detectors:
- The XFlash® 5010 with 10mm² active area for applications that require optimum energy resolution and light element performance,
- The 30 mm² XFlash® 5030 for cold field emission SEMs, environmental SEMs or TEMs,
- The four-channel XFlash® QUAD 5040 with four 10mm² sensors integrated on a single detector chip provides excellent energy resolution also at extremely high count rates, e.g. ideal for use on microprobes.
X-ray map of a SD memory chip
The QUANTAX EDS system combines theses detectors with Bruker’s unique hybrid pulse processors and the ESPRIT software. The large number of element lines with an energy of below 1 keV can be identified correctly. The result is a powerful and easy-to-use spectrometer that can be adapted to any task in elemental analysis with an electron microscope. QUANTAX therefore meets all requirements for modern EDS analysis at the nano-scale.
Bruker Nano Analytics Division
EDS microanalysis is used to determine the qualitative and quantitative element composition of a sample in a scanning electron microscope (SEM) or transmission electron microscope (TEM). Bruker Nano manufactures the QUANTAX EDS analysis system that provides fast and accurate results across a broad range of applications from materials science to life sciences. Part of QUANTAX are the technical leading liquid nitrogen-free XFlash® 6 silicon drift detectors (SDD) with unsurpassed energy resolution, even at high count rates. The QUANTAX EDS analysis system is complemented by the CrsytAlign EBSD analysis system for structural analysis in the SEM, featuring the unique e-Flash EBSD detector series.