SEM Chamber Viewing & Specimen Current Amplifiers

SEM Scanning Electron microscope Chamber Viewing SEM Scanning Electron microscope Chamber Viewing

The IR Chamber Scope offers continuous monitoring of the vacuum chamber for specimen collision avoidance and confirmation of retractable detectors. The compact design, with high brightness LEDs and adjustable camera make this system suitable for any sized vacuum chamber. A simple On/Off switch is provided so that solid state backscatter and EDS detectors are not affected by the infrared light.

Contact: SEMTech Solutions., Inc.
Web link: IR Chamber Scope
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Scanning electron microscope accessories Scanning electron microscope accessories

SEM Infrared Chamberscope for continuous monitoring of the detector position relative to the specimen and stage. Scanning electron microscope accessories include Specimen Current-EBIC Amplifier, Retractable Faraday Cup, Specimen Temperature Control, and Probe Current Meter.

Contact: KE Developments USA
Web link: Scanning electron microscope accessories
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Electron Microscopy Buyers Guide