Energy Dispersive X-ray Microanalysis EDS for TEM

EDAX’s Retractable Transmission Electron Microscope (r-TEM™) Detecting Unit provides the ultimate analytical performance. The r-TEM™ protects the crystal and electronics from high energy X-rays and electrons without compromising performance. The specially designed tungsten shutter mechanism allows for a large solid angle, translating into higher count rates and better performance.

Contact: EDAX Inc.
Web link: Apollo Series SDD
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Bruker is the first company to introduce silicon drift detectors specially designed for TEM operation. The XFlash® T detectors warrant minimum interference and optimum operating condition even for aberration corrected instruments, at the same time providing excellent light element and high count rate performance.

Contact: Bruker Nano
Product Details: XFlash® Silicon Drift Detectors
Web link: XFlash® Silicon Drift Detectors
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