Electron Backscatter Diffraction EBSD

Electron backscattered diffraction (EBSD), or backscattered Kikuchi diffraction (BKD), is a technique that is used to identify the crystal systme of a material and to map the crystallographic orientation. Electron backscattered diffraction is done in a scanning electron microscope. Electron Backscatter Diffraction (EBSD) obtains crystallographic information from tilted polished samples samples in a scanning electron microscope (SEM). The electron beam strikes the sample and the electrons are elastically scatter beneath the surface. Electrons diffracted according to Bragg's law form a pattern on a fluorescent screen. Each lattice plane is represented in the diffraction pattern by a Kikuchi band. By comparing to theoretical data, the crystallographic system of the material and orientation can be determined.

Fast and versatile EBSD HKL Channel 5

HKL Channel 5 is a research grade Electron Backscatter Diffraction system, now available with the NordlysF 400 camera achieving a 99% indexing hit rate at 400Hz on nickel.

Contact: Oxford Instruments NanoAnalysis
Web link: HKL Channel 5
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Powerful automated EBSD OIM™ - Orientation Imaging Microscopy

OIM™ - Orientation Imaging Microscopy, the most powerful automated EBSD system for analysis of crystalline microstructures. EDAX introduces the Hikari high speed, high sensitivity CCD detector which collects 450 indexed patterns per second. Available stand alone, with simultaneous EDS, or integrated EDS & WDX.

Contact: EDAX Inc.
Web link: OIM™ - Orientation Imaging Microscopy
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Easy to use EBSD QUANTAX CrystAlign EBSD system

Bruker offers the flexible and easy to use QUANTAX CrystAlign EBSD system with the unique e-Flash detectors, providing either high speed or high resolution data acquisition.

Contact: Bruker Nano
Web link: QUANTAX CrystAlign EBSD system
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Electron Microscopy Buyers Guide