FESEM - Field Emission Scanning Electron Microscope

The new Mira series of field emission scanning electron microscopes uses a high brightness Schottky-emitter for high-resolution / high-current / low-noise imaging.

Contact: Tescan USA, Inc.
Web link: field emission scanning electron microscopes
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MERLIN® is the enhanced GEMINI II column which, with its double condenser system, achieves an image resolution of 0.8 nanometers. A sample current of up to 300 nanoamperes is available for analytical purposes such as energy and wavelength dispersive X-ray spectroscopy (EDS and WDS), diffraction analysis of backscattered electrons (EBSD) or the generation of cathodoluminescence.

Contact: Carl Zeiss NTS, LLC
Product Details: Merlin FeSEM with Gemini Column
Web link: Carl Zeiss NTS homepage
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The SIGMA, featuring the unique and proven GEMINI® technology from Carl Zeiss, provides outstanding imaging and analytical results from a field emission microscope with the capability to handle all material types. Material analysis at high resolution is provided by the class leading X-ray geometry for both energy and wavelength dispersive spectroscopy (EDS and WDS).

Contact: Carl Zeiss NTS, LLC
Product Details: SIGMA Advanced Analytical Scanning Electron Microscope SEM
Web link: Carl Zeiss NTS homepage
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