Scanning Probe and Atomic Force Microscopes

Scanning probe microscopes generate images from the output signals of a scanning probe that is scanned over the surface of the sample in a point to point raster. At each point the probe measures one or more of a wide variety of variables that characterize the sample. Scanning probe techniques include Atomic Force Microscopy (AFM), Scanning Tunneling Microscopy (STM), and Scanning Near-field Optical Microscopy (SNOM).

AFM/SPM solutions

Bruker Nano provides user-friendly AFM/SPM solutions – featuring all common AFM/SPM modes - combined with optical microscopy (bright field, dark field, DIC, fluorescence etc.). Automated and large sample systems are available.

Contact: Bruker USA AFM division
Web link: AFM/SPM solutions
Request a quote or more information

Scanning Probe Microscopy Buyers Guide