Carl Zeiss NTS and SII NanoTechnology

Tokyo – March 16, 2006: Carl Zeiss Nano Technology Systems (NTS), a division of Carl Zeiss SMT, and SII NanoTechnology (SIINT), a subsidi-ary of Seiko Instruments Inc., today jointly announced a global strategic alliance in the electron and ion-beam systems, service and solutions market.

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Carl Zeiss SMT acquires ALIS Corporation

Start-up company for Helium-based microscopy to extend Carl Zeiss SMT’s technology portfolio

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JEOL USA Receives Sixth Consecutive Omega Award for Service

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Carl Zeiss SMT Forms New North American Headquarters in Peabody

Carl Zeiss SMT Inc. integrates national head- quarters for sales, applications and service operations with recently acquired ALIS Corporation, forming powerful customer interface center in Boston area

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New FE MultiBeam from JEOL

A new Field Emission MultiBeam, the model JIB-4600F, was introduced at M&M 2008.

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David H. Murdock Research Institute Specifies JEOL Cryo-electron Microscopes

Two of JEOL’s top-of-the-line cryo-electron microscopes will be key instrumentation for multi-disciplinary scientific advances in a new $1 billion research center in Kannapolis, North Carolina

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VESTA Wins Prestigious R&D 100 Award

Anasys Instruments has won the prestigious R&D 100 award for its new VESTA product, a tool which revolutionizes thermal analysis and enables customers to obtain phase transition temperatures with micro- and nanoscale resolution.

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XEI Scientific hires Tom Levesque as Global Sales Director

XEI Scientific, Inc. announced that they have retained new executive level advisors to direct worldwide sales and marketing.

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FEI Launches New Website for Natural Resources

FEI has launched a website for natural resources as part of an increased focus on the mining and oil & gas industries. The website will serve as a technical and educational resource.

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TESCAN names Vice-President of Sales & Marketing, North America

TESCAN, a leading world manufacturer of charge particle technology, has named Jeff Streger their Vice President of Sales and Marketing, North America.

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TESCAN, a.s. acquires TESCAN USA Inc.

TESCAN, a.s. is pleased to announce the acquisition of TESCAN USA Inc

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Indianapolis Museum of Art Aquires Carl Zeiss 'Shuttle & Find' Correlative Microscopy

Carl Zeiss today announced that the Indianapolis Museum of Art is using a Carl Zeiss 'Shuttle & Find' Correlative Microscopy package in the museum's new state-of-the-art conservation science laboratory funded by Lilly Endowment Inc.

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ndianapolis Museum of Art Uses New Microscope Technology to Improve Art Analysis

Art curators and conservators now can quickly get far more detailed information than ever before by using an integrated combination of light and electron microscopy

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Breakthrough in Ultra-High-Resolution Imaging of Non-Conductive Samples

Unique charge compensation technology from Carl Zeiss SMT enables usage of in-lens SE and EsB detectors with non-conductive samples.

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Hitachi and Hitachi High-Tech Receive IEEE Milestone for "First Practical Field Emission Microscope, 1972"

Hitachi and Hitachi High-Tech announced they had received the IEEE Milestone for Hitachi's pioneering development of the world's "First Practical Field Emission Electron Microscope, 1972" from the IEEE*1, the world's largest professional association in the electrical, electronics, information and communications engineering fields.

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New Series of Scanning Electron Microscopes

JEOL USA, has introduced a new series of high resolution tungsten scanning electron microscopes (SEMs) featuring multiple live image displays, streamlined graphical interface, and improved low kV operation.

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New Titan™ (S)TEM

New Titan(TM) (S)TEM, from FEI Company with resolution below 0.7 angstrom, surpasses previous world record performance for commercial systems.

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SEM and DualBeam™ systems from FEI

FEI Company today released the newest member of its Nova(TM) family of SEM and DualBeam(TM) systems, the Nova NanoSEM.

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New LaB6 TEM

JEOL has introduced a new LaB6 Transmission Electron Microscope (TEM) for a wide range of advanced, high-resolution imaging and analytical applications.

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TESCAN Announces new FE-SEM

Tescan USA's new Mira series of field emission scanning electron microscopes use a high brightness Schottky-emitter for high-resolution / high-current / low-noise imaging.

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Second Generation Vega-II SEM

Vega-II. Building upon the overwhelming success of the original Vega SEMs, Tescan is pleased to introduce the second generation Vega-II microscopes.

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FE-SEM from Carl Zeiss SMT

New SUPRA™ 40 series of ultra high resolution field emission scanning electron microscopes (FESEM), delivers nanoscale high resolution imaging.

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New ULTRA 55 FE-SEM

Featuring a totally new Complete Detection System (CDS) which enables simultaneous surface, compositional and crystallographic imaging down to the nanometer level.

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EVO® Offers Outstanding Versatility

Materials analysis. quality assurance, R&D, nanotechnology – EVO® is the new standard in scanning electron microscopy.

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Ultrahigh Resolution Field Emission SEM for Nanotechnology

JEOL is pleased to announce the introduction of a new Scanning Electron Microscope, the JSM-7500F, which achieves the highest resolution of any semi in-lens FE SEM (6 Angstroms at 30kV) and true 1,000,000 X imaging.

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NVision 40: High-end multi-functional CrossBeam® workstation

Joint development of Carl Zeiss SMT and SIINT results in enabling workstation for nanoscopic imaging, structuring and analysis

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New JEOL 120kV Transmission Electron Microscope

JEOL USA introduces the latest in imaging technology and microscopy automation with its new 120 kV high resolution Transmission Electron Microscope (TEM) which is optimized for biological, polymer, and materials research, combining both imaging and cryomicroscopy excellence.

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New Failure Analysis Tool from JEOL

The high spatial resolution and flexibility of the JEOL Beam Tracer allows this new failure analysis tool to precisely locate and mark defect sites in multi-layer semiconductor devices.

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Intellection provides safer, faster mineral analysis for geoscientists

Using new nitrogen-free X-ray detectors from Bruker AXS is enabling the QEMSCAN from Intellection to provide safer, faster and more reliable mineral processing tools for the international geoscience business community.

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Quanta 3D FEG Expands FEI's DualBeam™ Portfolio

The Quanta(TM) 3D FEG combines FEI's latest advances in ion and electron optics with the unique environmental SEM technology of FEI's Quanta family of products.

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New JEOL FE Analytical SEM for HV and LV Operation

A new thermal field emission analytical SEM from JEOL, the JSM-7001F, acquires high resolution micrographs at up to 1,000,000X for applications ranging from semiconductor, metals, minerals, materials, and ceramics, to non-conductive biological samples.

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ParticleSCAN with SmartPI— A New Dimension in Process Control

At the CONTROL trade fair in Sinsheim, Germany, Carl Zeiss SMTpresented the newly developed ParticleSCAN particle detection and analysis system for automated analysis of material samples in production environments.

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New TEM Enables View of Sub-atomic Details

A unique, high-performance electron microscope from Carl Zeiss SMT has been successfully installed at the caesar institute in Bonn, Germany.

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Groundbreaking Development Project for Biotechnologies

Carl Zeiss SMT has received an order to develop a unique high-performance transmission electron microscope for the high-resolution phase contrast imaging of biologic materials.

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New Monochromated ZEISS LIBRA® Transmission Electron Microscope

Innovative monochromator module for unrivalled spectroscopic imaging is now available for the ZEISS LIBRA® 200 TEM series.

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EVO® SEM Series pushing limits in materials and life science microscopy

The successful EVO® series of Scanning Electron Microscopes from Carl Zeiss SMT evolves to the Materials Analysis and Life Science range.

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FEI Introduces Nova NanoSEM™ 30 Series

FEI had introduced its latest and most powerful scanning electron microscope (SEM), the Nova NanoSEM(TM) 30 series.

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New "CarryScope" Mobile Scanning Electron Microscope

The JEOL CarryScope delivers several high resolution performance imaging and analytical capabilities in a new mobile package.

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MultiBeam SEM/FIB for Simultaneous Micro Milling and High Resolution SEM Imaging

A versatile all-in-one system that combines Focused Ion Beam micro milling with high resolution imaging.

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Nikon and JEOL Join Forces to Introduce NeoScope Benchtop SEM

Two of the world’s leading imaging equipment suppliers - Nikon Instruments and JEOL - have joined forces to bring a new benchtop SEM to the market. The two companies will jointly introduce the NeoScope at Pittcon 2008, March 3-6, in New Orleans, Louisiana.

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Intellection launches QEMSCAN® R-series

Intellection is taking sophisticated automated mineral analysis out into the field, with the launch of its new compact QEMSCAN® R-series.

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FEI Introduces Titan Krios™ TEM for Structural Biology

Revolutionary cryo transmission electron microscope (TEM) provides fast, fully-automated three-dimensional data about biological molecules and macromolecular complexes.

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Super Microprobe Installation at NIST

JEOL USA announced that it has completed installation and acceptance of its first thermal field emission electron microprobe in the United States. At NIST in Gaithersburg, Maryland,

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NeoScope Benchtop SEM

JEOL and Nikon have introduced a new compact benchtop SEM that is simple to use with automated settings for biological and materials samples.

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Multiple Software Enhancements to Advance TEM Imaging and Data Acquisition

JEOL introduced multiple software enhancements to advance TEM imaging and data acquisition at M&M 2008. at M&M 2008

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JEOL Introduces New Thermal FE-SEM

The new SEM integrates a semi in-lens system for high resolution imaging with an in-lens thermal electron gun.

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Extreme High Resolution Scanning Electron Microscopy

FEI Company (Nasdaq:FEIC) introduced a new class of instruments called extreme high-resolution scanning electron microscopes (XHR SEMs). The Magellan XHR SEM allows scientists and engineers to quickly see things they could not see before.

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MLA 600F High Speed Automated Mineralogy Analyzer for the Mining Industry

FEI Company, a leading provider of high-resolution imaging and analysis systems, today released the MLA 600F system, a high-speed automated mineralogy analyzer used in the mining industry to optimize the performance of mineral processing operations.

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New X-FEG Electron Source

FEI Company's new extreme field emission gun (X-FEG) electron source module for the Titan family of scanning transmission electron microscopes (S/TEMs).

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MIRA II High Resolution FE-SEM

TESCAN is proud to announce the launch of the second generation <strong>Mira-II</strong> series of field emission scanning electron microscopes. 

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Vega EasyProbe Touch Screen SEM with EDX

Tescan recently introduced the Vega EasyProbe with integrated One - Touch EDX microanalysis.

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JEOL Unveils Highest Resolution 200kV Aberration-corrected S/TEM

JEOL introduces the JEM-ARM200F atomic resolution analytical Scanning/Transmission Electron Microscope.

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Novelx Wins R&D 100 Award for Innovative Scanning Electron Microscope

Novelx mySEM® miniaturizes and drives the cost out of field emission scanning electron microscopes to distribute nanoscale imaging capabilities more broadly.

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Next Generation Tabletop Microscope

Hitachi High-Technologies Corporation (TOKYO:8036) today announced the development of the Tabletop Microscope TM3000.

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New Correlative Microscopy Tool for Observing in Atmosphere

JEOL introduced ClairScopetm, a first-of-its kind correlative microscopy tool that combines a high-end Light Microscope (LM) with a high-resolution Atmospheric Scanning Electron Microscope (ASEM)

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FEI Unveils New Capabilities for Natural Resource Extraction

Automated mineralogy technology suite now provides improved measurement and image analysis capabilities for mining, oil and gas and geoscience applications

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New Field Emission Scanning Electron Microscope

Agilent Technologies FE-SEM is a compact system that offers researchers a field emission scanning electron microscope for low-voltage, high-performance imaging in their own laboratory.

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Third generation of TESCAN scanning electron microscopes

Third generation of TESCAN microscopes cumulates nearly 20 years of experience from research, development and manufacturing of scanning electron microscopes, supplementary accessories for SEMs and other special products.

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Carl Zeiss to Develop and Distribute RoqSCAN™

Carl Zeiss announces that it has signed an exclusive, world-wide agreement with Fugro Robertson to develop and distribute RoqSCAN™

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LYRA GM FIB-SEM workstation, a New Multifunctional Tool for Nanotechnology

The LYRA GM FIB-SEM workstation from TESCAN delivers state of the art integration of a best-in-class Focused Ion Beam column and Field Emission Scanning Electron Microscope, while integrating an unprecedented range of nano-structuring, imaging, and nano-analytical tools.

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Magellan Extreme Resolution SEM for Life Sciences

The first of its kind, the Magellan SEM from FEI enables life science researchers and cell biologists to actually view the entire organization of a cell in its natural, fully-hydrated state. The Magellan's workflow solution, which includes cryogenic sample preparation and handling, is a repeatable, optimized process to provide the highest quality imaging and analysis results.

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TESCAN Integrated Mineral Analyzer

The recently introduced TESCAN Integrated Mineral Analyzer (TIMA) is a fully automated, high throughput, analytical scanning electron microscope is designed specifically for the mining and minerals processing industry.

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JEOL InTouchScope Scanning Electron Microscope Wins R&D 100 Award

The JEOL InTouchScope™ SEM, a touchscreen-controlled analytical, portable low vacuum Scanning Electron Microscope, has been recognized by the editors of R&D Magazine as one of the 100 most technologically significant products introduced into the marketplace over the past year.

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Hitachi High-Technologies Launches Sale of New SU9000 Scanning Electron Microscope

The SU9000, a new type of Field Emission Scanning Electron Microscope (FE-SEM) capable of ultra-high resolution imaging, is equipped with a electron source that enables ultra-high resolution observations, while minimizing sample damage caused by electron beams during observations.

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JEOL Introduces New Sub-nm Field Emission SEM Series

The JEOL JSM-7100F series offers sub-1 nm imaging capabilities and analytical characterization at the sub-100nm scale, accomplished through the combination of large beam currents with a small probe size at any accelerating voltage.

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New series of Field Emission Scanning Electron Microscopes from Hitachi

JEOL has announced two new field emission scanning electron microscopes, the JSM-7100F and the JSM-7100FT. Using a combination of large beam currents with a small probe size at any accelerating voltage the JEOL JSM-7100F series offers sub-1 nm imaging capabilities and sub-100nm analytical characterization for the budget-conscious lab. With a redesigned hybrid lens and energy filter through-the lens detectors, the JSM-7100FT provides imaging of nanostructures at high resolution imaging. At low kV aberrations are reduced resulting in higher resolution at the lowest accelerating voltages.

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Harvard to Collaborate with JEOL on High Resolution, 3D Brain Imaging

A collaborative effort to map and produce a 3D image of the entire mouse brain using high resolution SEM images has been established between JEOL USA and aHarvard University.

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