Oxford Instruments receives Queen’s Award for Enterprise

Oxford Instruments has been awarded The Queen’s Award for Enterprise : Innovation for the development of INCADryCool, a radical new, cooling technology for X-ray detectors used in electron beam microscopes.

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Oxford Instruments ships its 100th INCAx-act Analytical Drift Detector

Oxford Instruments shipped its 100th INCAx-act Analytical Drift Detector from its factory in the UK on May 11th 2007.

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David Williams wins first Duncumb Award for Excellence in Microanalysis

David Williams of Lehigh University wins first Duncumb Award for Excellence in Microanalysis.

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Bruker AXS Microanalysis is now Bruker Nano

To better align ourselves with our market and reflect our expanding product portfolio, Bruker AXS Microanalysis has changed its name to Bruker Nano.

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QUANTAX – Precision Tools for Nano-scale Analysis

Bruker Nano has pioneered the application of liquid nitrogen free silicon drifts detectors (SDDs)

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QUANTAX QUAD Innovative EDS System

Bruker AXS Microanalysis annouces the QUANTAX QUAD, an innovative new EDS system featuring the the first four-channel 40mm² Silicon Drift Detector for electron microscopy.

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Combined MicroBeam XRF/EDS

IXRF Systems: New XRF for your SEM in the Exclusively combined EDS/XRF data collection.

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Xphase Spectral Imaging Tool

Thermo Electron announces Xphase, a new method of identifying and visualizing the phase distribution within a sample. The latest Spectral Imaging tool for the NORAN System SIX X-ray microanalysis system.

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Spectral Match software

Thermo Electron announces Spectral Match software for automatically matching an unknown spectra to data stored in a spectral database.

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QUANTAX EDS Takes Microanalysis into the Fast Lane

Bruker AXS has introduced its innovative, high resolution QUANTAX EDS system, featuring the most advanced XFlash® detector ever. Powered by ESPRIT EDS software, the system delivers fast and reliable results across a broad range of applications.

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X-Ray Microanalysis Software Enables Remote Instrument Operation, Multiple Users

Bruker AXS today said that its ESPRIT Software Suite for their QUANTAX series X-Ray Microanalysis systems now includes features that allow remote instrument operation, as well as multiple user access.

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Two New Detector Technologies Revolutionise Microanalysis

INCA PentaFET-x3 is a powerful new Si(Li) detector, which has a 30mm 2 detecting crystal and INCA x-act is the worlds first Analytical Drift Detector.

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Thermo Upgrades its X-ray Microanalysis System

Combined with a newly introduced 30 mm 2 silicon drift detector, NORAN System SIX operates at ten times the efficiency of traditional X-ray microanalysis systems.

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XFlash QUAD Detector wins R&D 100 Award

Bruker AXS was awarded the prestigious R&D 100 Award for the novel XFlash(R) QUAD detector .

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New Forward Scatter Detector (FSD) for Electron Backscatter Diffraction

The Forward Scatter Detector from EDAX Inc. displays high structural contrast of the microstructure, relative to the Secondary Electron Image (SEI), at the 70° tilt typically used for EBSD data collection.

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New Hikari High-Speed EBSD Detector

The Hikari EBSD detector from EDAX provides a significant increase in pattern collection speed over current detector offerings on the market.

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OIM 3D Three- Dimensional Visualization Software

The OIM 3D from Edax is a the new three-dimensional visualization software for Orientation Imaging Microscopy (OIM) EBSD.

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EDAX Launches Apollo SDD

MAHWAH, NJ – EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has launched the Apollo Series SDD, the next generation of silicon drift detectors for X-ray microanalysis.

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XFlash® 4010 Silicon Drift Detector from Bruker AXS Inc.

XFlash® 4010 Silicon Drift Detector with 125 eV at 100,000 cps is now available from Bruker AXS Inc.

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EDAX Announces Enhancers for the Hikari Electron Backscatter Detector

EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, announced its latest advancements on high-speed EBSD data acquisition.

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QUANTAX EDS Features Advanced Microanalysis Tools

The latest release of ESPRIT software introduces new features and modules that can help you find elusive trace elements and make routine analysis easier than ever.

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Turbo-charged Analytical Silicon Drift Detector

Oxford Instruments INCAx-act now with PentaFET® Precision is a high quality Analytical SDD detector with a guaranteed Carbon resolution.

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New 50mm2 Transmission Electron Microscope (TEM) Detector

Oxford Instruments NanoAnalysis is pleased to announce the launch of a new 50mm² Si(Li) TEM EDS detector for users who want to maximise solid angle or minimise counting time.

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Advanced X-ray microanalysis capability for QEMSCAN

The successful integration of the world leading Quantax Esprit X-ray microanalyser software from Bruker AXS with the QEMSCAN® automated mineralogy system breaks new ground in advanced mineral analysis.

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New EBSD System from Bruker Microanalysis

Bruker Microanalysis has introduced the QUANTAX EBSD system for SEM based crystallographic analysis.

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Duncumb Award Winner 2008, Dr. Joseph Goldstein

Bruker AXS, in cooperation with The Microbeam Analysis Society, is proud to announce this year’s winner of the Duncumb Award for Excellence in Microanalysis.

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New Ultra-High Energy Resolution XFlash® 5000 Silicon Drift Detector Series

The XFlash 5000 detectors from Bruker AXS Microanalysis boast improved energy resolutions down to 123 eV at Mn-K and 100,000 cps input count rate.

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New Intelligent Wavelength Dispersive X-ray Spectrometer

Thermo Fisher Scientific Inc. launched the first intelligent Wavelength Dispersive X-ray spectrometer (WDS), the Thermo Scientific MagnaRay WDS Spectrometer. The instrument automatically combines energy dispersive spectroscopy (EDS) results with WDS operations using the embedded expert system.

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New EDS Detector Opens Up a New World of Analysis

Oxford Instruments releases the new X-Max Silicon Drift Detector (SDD) providing electron microscopists with the biggest area detector ever - over TEN times the solid angle of conventional EDS detectors.

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Expert ID Provides Revolutionary New Routine for Accurate Element Identification

EDAX Inc. has launched EXpert ID, which provides a significant increase in peak identification accuracy based on an advanced physics and rules-based algorithm.

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Latest Generation of Electron Backscatter Diffraction Detectors Launched

EDAX Inc. launches DigiView IV bringing all of the advanced features of orientation mapping and calculations to the materials calculation scientist.

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Genesis Apex System for Accurate X-ray Microanalysis

EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has launched the Genesis Apex X-ray microanalysis system

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MonoCL4 System from Gatan

MonoCL4 is the next generation in the world-leading family of cathodoluminescence (CL) systems.

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New High Performance Detector for Electron Backscatter Diffraction (EBSD)

Bruker AXS Microanalysis presents the e-Flash, a new high performance detector for electron backscatter diffraction (EBSD) analysis on scanning electron microscopes (SEM).

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Silicon Drift Detector (SDD) for Transmission Electron Microscopes

Bruker AXS Microanalysis presents Xflash® 5030 T, the first silicon drift detector (SDD) specifically designed for energy dispersive X-ray spectroscopy (EDS) on transmission electron microscopes (TEM/STEM).

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TEAM EDS System from EDAX

State-of-the Art System Incorporates Smart Features For Better Quality and More Reliable Results

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Latest Advancements in the Apollo SDD detectros for X-ray Microanalysis

EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has introduced the next series of Apollo SDD detectros for X-ray microanalysis.

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Apollo Silicon Drift Detector (SDD) Series for TEM

EDAX has release of the Apollo Silicon Drift Detector (SDD) Series for the transmission electron microscope (TEM). The new series includes the Apollo XLT with a Super Ultra Thin Window (SUTW) and the Apollo XLTW, a windowless version.

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Large Area Silicon Drift Detector for Transmission Electron Microscopes

The highly successful X-Max 80 detector is now available for use on Transmission Electron Microscopes. This detector has solid angles significantly greater than any commercially available SDD for TEM.

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