Focused Ion Beam Microscopy and Micromachining

This introductory article covers thebasic FIB instrument and the fundamentals of ion–solid interactions that lead to themany unique FIB capabilities as well as some of the unwanted artifacts associated withFIB instruments.

From: FEI Company
Link: Focused Ion Beam Microscopy and Micromachining

Introduction to Electron Microscopy

Read the FEI booklet "An Introduction to Electron Microscopy", an excellent resource on electron microscopy and nanotechnology for students and teachers

From: FEI Company
Link: Introduction to Electron Microscopy