JEOL InTouchScope Scanning Electron Microscope Wins R&D 100 Award
June 30, 2011 (Peabody, MA) -- The JEOL InTouchScope™ SEM, a touchscreen-controlled analytical, portable low vacuum Scanning Electron Microscope, has been recognized by the editors of R&D Magazine as one of the 100 most technologically significant products introduced into the marketplace over the past year.
“This is a significant honor for JEOL because the InTouchScope is the first SEM to combine the convenience of multi-touch screen operation, analytical versatility, and ease of use in a very portable, small electron microscope. We’re delighted that it has become a very popular product and that it has been recognized with this prestigious award,” said Donna Guarrera, SEM Product Manager at JEOL USA.
Introduced in September 2010, the InTouchScope has been selected by microscopy labs throughout the U.S. for a variety of routine and research applications. It features integrated Energy Dispersive Spectroscopy (EDS) with the latest Silicon Drift Detector (SDD) technology, automated stage navigation capability, wireless capability, high and low vacuum operation, and a magnification range of 5X – 300,000X. The multi-touch operating screen has the familiar look of today’s personal electronic media.
The R&D 100 Awards are a benchmark of excellence for industry sectors as diverse as telecommunications, high-energy physics, software, manufacturing, and biotechnology. Since 1963, the R&D 100 Awards have identified revolutionary technologies newly introduced to the market.