Oxford Instruments NanoAnalysis

microanalysis EDX systems for electron microscopes.

Description

We provide tools to determine the presence, concentration and configuration of elements within samples, and the thickness of coating materials on a variety of surfaces, using: microanalysis, X-ray fluorescence analysis, and Coating thickness measurement.

Contact Oxford Instruments NanoAnalysis

Send a Request for Brochure or Quote Email: nanoanalysis@oxinst.co.uk
Phone: 44 (0)1494 442255
Fax: 44 (0)1494 461033

Halifax Road
High Wycombe, HP12 3SE
United Kingdom

Links

Home page
Electron Backscatter Diffraction EBSD
Energy Dispersive X-ray Microanalysis (EDS, EDX)
Energy Dispersive X-ray Spectroscopy Detectors
SEM EDS Energy Dispersive X-ray Microanalysis
Si(Li) & Silicon Drift Detectors for EDS
WDX Wavelength Dispersive X-ray Detectors

Contact form for more information.

Resource Links included in Microscopy.info

Technical Overviews

Oxford Instruments X-ray Microanalysis Site

Oxford Instruments Analytical www.ebsd.com

SDD Explained PDF download

Articles, Research News and Press Releases included in Microscopy.info

Product News

Get 60% more sensitivity with NordlysNano

Large Area Silicon Drift Detector for Transmission Electron Microscopes

AZtec Vision for Nanoanalysis Launched

Company News

Educational Website www.ebsd.com Launched by Oxford Instruments NanoAnalysis

Oxford Instruments Installs its 1000th X-Max

Organizations