Advanced MicroBeam promotes electron microscopy through the development and production of the world’s finest after-market electron microprobe automation systems and instrumentation. Probe for Windows, a comprehensive suite of analytical programs, performs quantitative analysis using high-resolution wavelength dispersive x-ray spectrometers. Designed to control a wide array of electron microprobes, Probe for Windows provides a durable analytical foundation with exceptional features for research scientists and technicians. Advanced MicroBeam also supplies energy dispersive analytical systems, digital imaging systems, and electron microprobe analytical services.

Email: dlesher@advancedmicrobeam.com
Phone: 330-394-1255
Fax: 330-394-1834
4217C King Graves Rd
PO Box 610
Vienna, OH 44473-0610
United States

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Electron microprobe analysis
Electron microprobe WDS automation