FEI Company

DualBeam (FIB/SEM), FIB, SEM, TEM, and ESEM products

Description

FEI is a leading diversified scientific instruments company. It is a premier provider of electron and ion-beam microscopes and tools for nanoscale applications across many industries: industrial and academic materials research, life sciences, semiconductors, data storage, natural resources and more. With a 60-year history of technological innovation and leadership, FEI has set the performance standard in transmission electron microscopes (TEM), scanning electron microscopes (SEM) and DualBeams™, which combine a SEM with a focused ion beam (FIB). FEI’s imaging systems provide 3D characterization, analysis and modification/prototyping with resolutions down to the sub-Ångström (one-tenth of a nanometer) level. FEI’s NanoPorts in North America, Europe and Asia provide centers of technical excellence where its world-class community of customers and specialists collaborate.

Contact

Send a Request for Brochure or Quote Email: sales@feico.com
Tollfree: 1-866 MY FEI CO
Phone: 503-726 7500
Fax: 503-726 7509

5350 NE Dawson Creek Drive
Hillsboro, OR 97124-5793
United States

Home page

Contact form for more information.

Resource Links included in Microscopy.info

Tutorials, Webinars, Course Notes

Learning Resources from FEI

Introductions and Briefs

Focused Ion Beam Microscopy and Micromachining

Introduction to Electron Microscopy

Image Galleries

FEI Company's Owner Image Contest

FEI Image Gallery

Technical Overviews

4D Electron Tomography

Articles, Research News and Press Releases included in Microscopy.info

Product News

New Titan G2 80-200 With ChemiSTEM Technology

Vion PFIB System for Advanced IC Packaging

FEI Unveils New Capabilities for Natural Resource Extraction

Company News

FEI Launches New Website for Natural Resources

Research News

UCLA’s Dr. Hong Zhou Breaks Resolution Barrier and Achieves Atomic Resolution of Viruses

Abberation Corrected Electron Microscopes