FEI is a premier provider of electron and ion-beam microscopes and tools for nanoscale applications across many industries including ndustrial and academic materials research, life sciences, semiconductors, data storage, and natural resources. FEI has set the performance standard in transmission electron microscopes (TEM), scanning electron microscopes (SEM) and DualBeams™, which combine a SEM with a focused ion beam (FIB). FEI’s imaging systems provide 3D characterization, analysis and modification/prototyping with resolutions down to the sub-Ångström (one-tenth of a nanometer) level.

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