IXRF Systems provides new EDS systems and detectors for scanning and transmission electron microscopes, EDS system upgrades with digital imaging and light element window detectors, and combined EDS/XRF using the new fX-SEM™ Tube as the source of the x-ray photons and a high- quality EDS detector to produce accurate quantitative analysis even for trace elements in a scanning electron microscope. Expect more from your Microanalysis Company.

Email: info@ixrfsystems.com
Phone: 281-286-6485
Fax: 281-461-8809
151715 Brookford Road
Houston, TX 77059
United States

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