Carl Zeiss NTS - Nano Technology Systems

FIB workstations, variable and conventional scanning and transmission electron microscopes

Description

Carl Zeiss NTS (Nano Technology Systems Division) offers a complete range of leading-edge microscopy and analysis instruments, including: FE-SEMs, multipurpose and extended pressure SEMs, energy filtering TEMs, CrossBeam® FIB/SEM workstations, and resolution record-setting Helium ion microscopes - providing solutions for the semiconductor, materials analysis and life science industries. With this broad product portfolio, Carl Zeiss NTS offers one-stop solutions for imaging — including 3D volume rendering and reconstruction — testing, characterization, manipulation, process control and failure analysis.

Contact Carl Zeiss NTS - Nano Technology Systems

Send a Request for Brochure or Quote Email: info-nts@nts.zeiss.com
Phone: 07364 20-44 88
Fax: 07364 20-43 43

Carl Zeiss-Str. 56
Oberkochen, 73447
Germany

Links

Home page

Contact form for more information.

Resource Links included in Microscopy.info

Investigations

Fascinating Images Reveal Climbing Abilities of Geckos and Spiders

Articles, Research News and Press Releases included in Microscopy.info

Company News

Indianapolis Museum of Art Aquires Carl Zeiss 'Shuttle & Find' Correlative Microscopy

Carl Zeiss Introduces Correlative Light and Electron Microscopy Solution for Life Sciences

Research News

Second Phase of the Sub-angstrom Low Voltage Electron Microscope (SALVE) project

Organizations