Carl Zeiss NTS - Nano Technology Systems

FIB workstations, variable and conventional scanning and transmission electron microscopes

Description

Carl Zeiss NTS (Nano Technology Systems Division) offers a complete range of leading-edge microscopy and analysis instruments, including: FE-SEMs, multipurpose and extended pressure SEMs, energy filtering TEMs, CrossBeam® FIB/SEM workstations, and resolution record-setting Helium ion microscopes - providing solutions for the semiconductor, materials analysis and life science industries. With this broad product portfolio, Carl Zeiss NTS offers one-stop solutions for imaging — including 3D volume rendering and reconstruction — testing, characterization, manipulation, process control and failure analysis.

Contact Carl Zeiss NTS - Nano Technology Systems

Send a Request for Brochure or Quote Email: info-nts@nts.zeiss.com
Phone: 07364 20-44 88
Fax: 07364 20-43 43

Carl Zeiss-Str. 56
Oberkochen, 73447
Germany

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Articles, Research News and Press Releases included in Microscopy.info

Company News

Indianapolis Museum of Art Aquires Carl Zeiss 'Shuttle & Find' Correlative Microscopy

Carl Zeiss Introduces Correlative Light and Electron Microscopy Solution for Life Sciences

Research News

Second Phase of the Sub-angstrom Low Voltage Electron Microscope (SALVE) project