Carl Zeiss NTS SAS

FIB workstations, variable and conventional scanning and transmission electron microscopes

Description

Carl Zeiss NTS (Nano Technology Systems Division) offers a complete range of leading-edge microscopy and analysis instruments, including: FE-SEMs, multipurpose and extended pressure SEMs, energy filtering TEMs, CrossBeam® FIB/SEM workstations, and resolution record-setting Helium ion microscopes - providing solutions for the semiconductor, materials analysis and life science industries. With this broad product portfolio, Carl Zeiss NTS offers one-stop solutions for imaging — including 3D volume rendering and reconstruction — testing, characterization, manipulation, process control and failure analysis.

Contact

Send a Request for Brochure or Quote Email: info-fr@nts.zeiss.com
Tollfree:
Phone: 33 1 41 39 92 10
Fax:

Zone dActivit des Peupliers
27, rue des Peupliers - Batiment A
NANTRERRE, F-92000
France

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Technological Advancements

New development in FESEM Technology

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