Bruker Nano

EDS microanalysis for SEMs and TEMs, EBSD

Description

EDS microanalysis allows to determine the qualitative and quantitative element composition of a sample using a scanning electron microscope (SEM) or transmission electron microscope (TEM). Bruker Nano manufactures the QUANTAX EDS analysis system that provides fast and accurate results across a broad range of applications from materials science to life sciences. Part of QUANTAX are the technical leading liquid nitrogen-free XFlash silicon drift detectors (SDD) with unsurpassed energy resolution, even at high count rates. The QUANTAX EDS analysis system is complemented by the CrsytAlign EBSD analysis system for structural analysis in the SEM, featuring the unique e-Flash EBSD detector series.

Contact Bruker Nano

Send a Request for Brochure or Quote Email: info-ewing@bruker-nano.com
Phone: 609 771-4400
Fax: 609 771 4411

1239 Parkway Ave
Suite 203
Ewing, NJ 08623
United States

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Company News

Bruker Nano wins Supplier Award 2009 from FEI for Most Innovative Supplier

Bruker AXS Microanalysis is now Bruker Nano

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