EDS microanalysis is used to determine the qualitative and quantitative element composition of a sample in a scanning electron microscope (SEM) or transmission electron microscope (TEM). Bruker Nano manufactures the QUANTAX EDS analysis system that provides fast and accurate results across a broad range of applications from materials science to life sciences. Part of QUANTAX are the technical leading liquid nitrogen-free XFlash® 6 silicon drift detectors (SDD) with unsurpassed energy resolution, even at high count rates. The QUANTAX EDS analysis system is complemented by the CrsytAlign EBSD analysis system for structural analysis in the SEM, featuring the unique e-Flash EBSD detector series.

Email: info@bruker-nano.de
Phone: +49 (30) 67 09 90-0
Fax: +49 (30) 67 09 90-30
Schwarzschildstrasse 12
Berlin, 12489
Germany

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QUANTAX microanalysis system
QUANTAX CrystAlign EBSD system
XFlash® Silicon Drift Detectors
XFlash® Silicon Drift Detectors
M4 TORNADO ultra-fast tabletop µ-XRF spectrometer
Micro-CT for SEM