EDS microanalysis allows to determine the qualitative and quantitative element composition of a sample using a scanning electron microscope (SEM) or transmission electron microscope (TEM). Bruker Nano manufactures the QUANTAX EDS analysis system that provides fast and accurate results across a broad range of applications from materials science to life sciences. Part of QUANTAX are the technical leading liquid nitrogen-free XFlash silicon drift detectors (SDD) with unsurpassed energy resolution, even at high count rates. The QUANTAX EDS analysis system is complemented by the CrsytAlign EBSD analysis system for structural analysis in the SEM, featuring the unique e-Flash EBSD detector series.

Email: info@bruker-nano.de
Phone: +49 (30) 67 09 90-0
Fax: +49 (30) 67 09 90-30

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Berlin, 12489
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EDX & SDD Detectors for Scanning Electron Microscopes
EDX & SDD Detectors for Scanning Electron Microscopes
Electron Backscatter Diffraction EBSD
Energy Dispersive X-ray Microanalysis EDS for TEM
Micro X-Ray Fluorescence
SEM EDS Energy Dispersive X-ray Microanalysis
SEM EDS Energy Dispersive X-ray Microanalysis

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High Resolution X-ray Spectroscopy close to Room Temperature

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Bruker Nano Introduces the M1 MistralSDD

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Bruker Announces the e FlashHR – a New High-Resolution EBSD Detector