EDS microanalysis is used to determine the qualitative and quantitative element composition of a sample in a scanning electron microscope (SEM) or transmission electron microscope (TEM). Bruker Nano manufactures the QUANTAX EDS analysis system that provides fast and accurate results across a broad range of applications from materials science to life sciences. Part of QUANTAX are the technical leading liquid nitrogen-free XFlash silicon drift detectors (SDD) with unsurpassed energy resolution, even at high count rates. The QUANTAX EDS analysis system is complemented by the CrsytAlign EBSD analysis system for structural analysis in the SEM, featuring the unique e-Flash EBSD detector series.

Email: info@bruker-nano.de
Phone: +49 (30) 67 09 90-0
Fax: +49 (30) 67 09 90-30

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Berlin, 12489
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Electron Backscatter Diffraction EBSD
Energy Dispersive X-ray Microanalysis (EDS, EDX)
Energy Dispersive X-ray Microanalysis EDS for TEM
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SEM EDS Energy Dispersive X-ray Microanalysis
Si(Li) & Silicon Drift Detectors for EDS

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Techniques

High Resolution X-ray Spectroscopy close to Room Temperature

Product News

New Large Area EDS Detector for Transmission Electron Microscopy

M4 Tornado µ-XRF for Rapid Accurate Micro X-ray Fluoresence

Bruker Nano Introduces the M1 MistralSDD

Bruker Announces the e FlashHR – a New High-Resolution EBSD Detector

Company News

Bruker Nano wins Supplier Award 2009 from FEI for Most Innovative Supplier

Bruker AXS Microanalysis is now Bruker Nano