STS Elionix

Using multiple detectors and proprietary technology, the electron beam surface roughness analyzers are capable of obtaining combined information similar to your SEM and AFM, but much quicker and easier. In addition, the Elionix Electron Beam Lithography systems are world renowned, writing lines of 8 nm or less. Also, Elionix has developed a Nanoindenter line that will be introduced into the U.S. in the Fall of 2006.