(July, 2006 Santa Clara, CA) --.Pacific Nanotechnology, Inc. (PNI) first dedicated SPM system for the characterization of nanoparticles is being accepted by researchers the world over. It is based on the new PNI Nano-R2™ platform with enhanced hardware and software to deliver a productive, easy-to-use system that is truly innovative.

The Nano-RP is a complete particle characterization system. It utilizes an atomic force microscope designed for capturing three-dimensional images of nanoparticles. This stateof-the-art laboratory SPM may be used in both EZMode™ and X’pertMode™ through the user friendly SPM Cockpit™ software platform.

One leading research group using the Nano-Rp is based at the University of California, Irvine. Group leader, Dr. Martha Mecartney says “PNI has identified a critical need in nanoscale technology and measurements in the real world and responded with a unique approach to easily and reliably measure and characterize nanoparticles. They not only developed innovative hardware and software but also designer substrates for optimal deposition and imaging of specific types of nanoparticle.”

The Nano-RP system includes everything required for nanoparticle characterization. The AFM allows the user to visualize 2D and 3D topography as well as to measure the nanoparticle’s average size, size distribution and 2D concentration.

Preparation of the nanoparticles for study is simplified through provision of extremely flat activated substrates. The samples are first fixed (anchored) and then placed on the microscope stage for scanning.

Analysis is performed using the NanoRule+™ particle characterization software package. The software enables the user to present data in a wide variety of convenient formats including exportable tables and graphs.

Pacific Nanotechnology, Inc. is the only applications-oriented solution provider in the world of the nanometer: PNI designs, develops, manufactures and supplies products and services to the fields of nanotechnology and nanoscience. There is a broad customer base: In academic research where the goal is to advance the frontiers of knowledge where nanoscale characterization and measurements are critical. And to industrial customers where in the development of new products, there is a need to be visualize and measure nanometer scale dimensions and in manufacturing where there is the need to control processes for products that have tolerances in the nanometer size range.