November 28, 2006 (Peabody, Mass) -- JEOL USA Inc. today announced that the DART™ (Direct Analysis in Real Time) technology for open-air mass spectrometry has been awarded U.S. Patent No. 7,112,785
by the U.S. Patent and Trademark office. The patent covers the method of ionization of the DART process.
This is the second U.S. patent covering the DART device and technology. The first patent was awarded in September 2005. The award-winning DART was commercially introduced in February 2005 for
the JEOL AccuTOFTM time-of-flight mass spectrometer. JEOL has more than 50 DART ion sources in operation today.
"We believe that DART technology will play a significant role in the future of mass spectrometry and are pleased that the U.S. patent office has recognized the unique characteristics of the DART method," said Dr. Robert Cody. Dr. Cody of JEOL USA and Dr. James Laramee, a former consultant - now with SAIC - are co-inventors of the DART.
DART is a unique ion source for mass spectrometry, in that samples are analyzed in open air. No radioactive components, solvent sprays, exposed high voltage, or vacuum are used to alter the sample
state.
DART has gained wide acceptance in forensics analysis, homeland security, and pharmaceutical screening, as well as chemical synthesis and environmental applications. DART technology can eliminate or reduce sample preparation and complements existing LC or GC analytical techniques.
JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs),
instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.
JEOL USA, Inc., is a wholly owned subsidiary of JEOL, Ltd., Japan, was incorporated in the United States in 1962. The company has 13 regional service centers that offer unlimited emergency service and support in the U.S.