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Micro and Nano Manipulation Accessories for Oxford Instruments

Oxford Instruments NanoAnalysis America is pleased to announce an agreement with Kleindiek Nanotechnik (Reutlingen Germany, www.nanotechnik.com) to become the North Americans sales and service representative for Kleindiek micro- and nano-manipulation systems for electron microscopy and focused ion beam (FIB) applications.

Oxford Instruments Nano-Analysis is the world’s leading supplier of X-ray analysis systems that provide detailed structural and chemical information at the micro and nano-scale, extending the capabilities of Scanning (SEM) and Transmission (TEM) Electron Microscopes.

The combination of Kleindiek’s versatile tools for manipulation and characterization of nano materials and Oxford Instruments’ first class line of Energy dispersive X-ray spectroscopy (EDS), Wavelength dispersive X-ray spectroscopy (WDS) and (Electron Backscatter Diffraction) EBSD systems delivers a powerful range of accessories for any EM or FIB.

“The Kleindiek tools for nano-manipulation and characterization is an excellent addition to our existing portfolio of analytical systems for Electron and Ion Beam columns. Oxford Instruments can now offer a much broader range of tools to our customers for analysis of nano-features in the SEM, TEM or FIB ” said Joe Carr, Director of Regional Sales & Service.
Oxford Instruments NanoAnalysis America

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