As a response to the increased demand for affordable high-quality AFM calibration standards, BudgetSensors®, a Bulgarian manufacturer of silicon and silicon nitride probes, as well as AFM accessories for Atomic Force Microscopes (AFM), announces the commercial introduction of 2 different AFM height calibration standards – the HS-100MG and the HS-20MG.

Both height calibration standards feature silicon dioxide structure arrays on a 5x5mm silicon chip. The fabrication process guarantees excellent uniformity of the structures across the chip. This in turn ensures easy and reliable Z-axis calibration of any AFM system.

Arrays of structures with different shape and pitch are integrated on each chip.
Aside from Z-axis calibration, this design also allows X- and Y-axis calibration for bigger scanners (40-100µm range).

The HS-100MG features structures with 100nm and the HS-20MG features structures with 20nm step height.