Novelx Wins R&D 100 Award for Innovative Scanning Electron Microscope 

Novelx mySEM ® miniaturizes and drives the cost out of field emission scanning electron microscopes to distribute nanoscale imaging capabilities more broadly. 

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FEI’s New Tecnai Osiris Transmission Electron Microscope 

Fast, easy-to-use S/TEM dramatically increases productivity in semiconductor manufacturing and materials science applications. 

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JEOL Unveils Highest Resolution 200kV Aberration-corrected S/TEM 

JEOL introduces the JEM-ARM200F atomic resolution analytical Scanning/Transmission Electron Microscope. 

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Vega EasyProbe Touch Screen SEM with EDX 

Tescan recently introduced the Vega EasyProbe with integrated One - Touch EDX microanalysis. 

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New X-FEG Electron Source 

FEI Company's new extreme field emission gun (X-FEG) electron source module for the Titan family of scanning transmission electron microscopes (S/TEMs). 

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Multiple Software Enhancements to Advance TEM Imaging and Data Acquisition 

JEOL introduced multiple software enhancements to advance TEM imaging and data acquisition at M&M 2008. at M&M 2008 

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