MonoCL4 System from Gatan 

MonoCL4 is the next generation in the world-leading family of cathodoluminescence (CL) systems.  

Read Press Release

New High Performance Detector for Electron Backscatter Diffraction (EBSD) 

Bruker AXS Microanalysis presents the e-Flash, a new high performance detector for electron backscatter diffraction (EBSD) analysis on scanning electron microscopes (SEM). 

Read Press Release

Silicon Drift Detector (SDD) for Transmission Electron Microscopes 

Bruker AXS Microanalysis presents Xflash® 5030 T, the first silicon drift detector (SDD) specifically designed for energy dispersive X-ray spectroscopy (EDS) on transmission electron microscopes (TEM/STEM). 

Read Press Release

Genesis Apex System for Accurate X-ray Microanalysis 

EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has launched the Genesis Apex X-ray microanalysis system 

Read Press Release

Expert ID Provides Revolutionary New Routine for Accurate Element Identification 

EDAX Inc. has launched EXpert ID, which provides a significant increase in peak identification accuracy based on an advanced physics and rules-based algorithm. 

Read Press Release

Latest Generation of Electron Backscatter Diffraction Detectors Launched 

EDAX Inc. launches DigiView IV bringing all of the advanced features of orientation mapping and calculations to the materials calculation scientist. 

Read Press Release