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Guide to Microscopes and Microanalysis

Product News:

EM Detectors, EDX, EBSD, BSE

MonoCL4 System from Gatan 

MonoCL4 is the next generation in the world-leading family of cathodoluminescence (CL) systems.  

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New High Performance Detector for Electron Backscatter Diffraction (EBSD) 

Bruker AXS Microanalysis presents the e-Flash, a new high performance detector for electron backscatter diffraction (EBSD) analysis on scanning electron microscopes (SEM). 

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Silicon Drift Detector (SDD) for Transmission Electron Microscopes 

Bruker AXS Microanalysis presents Xflash® 5030 T, the first silicon drift detector (SDD) specifically designed for energy dispersive X-ray spectroscopy (EDS) on transmission electron microscopes (TEM/STEM). 

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Genesis Apex System for Accurate X-ray Microanalysis 

EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has launched the Genesis Apex X-ray microanalysis system 

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Expert ID Provides Revolutionary New Routine for Accurate Element Identification 

EDAX Inc. has launched EXpert ID, which provides a significant increase in peak identification accuracy based on an advanced physics and rules-based algorithm. 

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Latest Generation of Electron Backscatter Diffraction Detectors Launched 

EDAX Inc. launches DigiView IV bringing all of the advanced features of orientation mapping and calculations to the materials calculation scientist. 

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