Multiple Software Enhancements to Advance TEM Imaging and Data Acquisition
JEOL introduced multiple software enhancements to advance TEM imaging and data acquisition
at M&M 2008
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JEOL Introduces New Thermal FE-SEM
The new SEM integrates a semi in-lens system for high resolution imaging with an in-lens thermal electron gun.
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NeoScope Benchtop SEM
JEOL and Nikon have introduced a new compact benchtop SEM that is simple to use with automated settings for biological and materials samples.
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Nikon and JEOL Join Forces to Introduce NeoScope Benchtop SEM
Two of the world’s leading imaging equipment suppliers - Nikon Instruments and JEOL - have joined forces to bring a new benchtop SEM to the market. The two companies will jointly introduce the NeoScope at Pittcon 2008, March 3-6, in New Orleans, Louisiana.
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Intellection launches QEMSCAN® R-series
Intellection is taking sophisticated automated mineral analysis out into the field, with the launch of its new compact QEMSCAN® R-series.
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FEI Introduces Titan Krios(TM) TEM for Structural Biology
Revolutionary cryo transmission electron microscope (TEM) provides fast, fully-automated three-dimensional data about biological molecules and macromolecular complexes.
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