Xflash® 5000 Liquid-Nitrogen Free Detectors 

Bruker AXS Microanalysis is proud to announce the Xflash® 5000 series of liquid-nitrogen free Xflash® silicon drift detectors for use with the QUANTAX microanalysis systems. 

Read Press Release

New EBSD System from Bruker Microanalysis 

Bruker Microanalysis is introducingt he new QUANTAX EBSD system for SEM based crystallographic analysis via electron backscatter diffraction (EBSD) 

Read Press Release

Duncumb Award Winner 2008, Dr. Joseph Goldstein 

Bruker AXS, in cooperation with The Microbeam Analysis Society, is proud to announce this year’s winner of the Duncumb Award for Excellence in Microanalysis. 

Read Press Release

Turbo-charged Analytical Silicon Drift Detector 

Oxford Instruments INCAx-act now with PentaFET® Precision is a high quality Analytical SDD detector with a guaranteed Carbon resolution. 

Read Press Release

QUANTAX EDS Features Advanced Microanalysis Tools 

The latest release of ESPRIT software introduces new features and modules that can help you find elusive trace elements and make routine analysis easier than ever. 

Read Press Release

Advanced X-ray microanalysis capability for QEMSCAN 

The successful integration of the world leading Quantax Esprit X-ray microanalyser software from Bruker AXS with the QEMSCAN® automated mineralogy system breaks new ground in advanced mineral analysis. 

Read Press Release