News Feed from Review of Scientific Instruments

A charge coupled device camera with electron decelerator for intermediate voltage electron microscopy

Kenneth H. Downing and Paul E. Mooney
Electron microscopists are increasingly turning to intermediate voltage electron microscopes (IVEMs) operating at 300400 kV for a wide range of studies. They are also increasingly taking advantage of slow-scan charge coupled device (CCD) cameras, which have become widely used on electron microscope ... [Rev. Sci. Instrum. 79, 043702 (2008)] published Fri Apr 18, 2008.

New surface forces apparatus using two-beam interferometry

Hiroshi Kawai, Hiroshi Sakuma, Masashi Mizukami, Takashi Abe, Yasuhiro Fukao et al.
We designed a new surface forces apparatus for measuring the interactions between two nontransparent substrates and/or in nontransparent liquids. The small displacement of a surface, the bottom one in this study, was measured by the two-beam (twin path) interferometry technique using the phase diffe ... [Rev. Sci. Instrum. 79, 043701 (2008)] published Wed Apr 9, 2008.