FIB Sample Preparation

Supplies for FIB and SEM/FIB

Supplies for FIB and SEM/FIB systems including Omniprobe AutoProbe™ lift-out tools and TEM sample holders. Contact Electron Microscopy Sciences

Supplies for FIB and SEM/FIB systems including Ion Sputter Standards, Omniprobe AutoProbe™ lift-out tools, and FIB sample mounts. Contact Ted Pella, Inc.

What is a Focused Ion Beam (FIB)?

The Focused Ion Beam (FIB) system uses a finely focused beam of gallium ions to raster over the surface of a sample. The Ga+ beam sputters sputters a small amount of surface material which leaves the surface as either secondary ions or neutral atoms. Secondary electrons are emitted. The primary beam also produces secondary electrons. Sputtered ions and secondary electrons can be used to form an image of the the sample. For TEM sample preparation, the FIB is used to mill samples surfaces and cross section materials.

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