Field emission scanning electron microscopes (FESEM) deliver ultra-high resolutions down to 1 nm for the most demanding electron microscope applications. The ultra-high resolution FESEMs operate over the complete voltage range with probe currents up to 20 nA and are available with variable chamber pressure technology.
The new Mira series of field
emission scanning electron microscopes uses a high brightness Schottky-emitter for high-resolution / high-current / low-noise
imaging. Contact Tescan USA
Reconditioned field emission scanning electron microscopes including a LEO 1560 FE-SEM with a Gemini Column and a JEOL 6700F with conical lens. Current SEM inventory.
Contact SEMTech
Solutions.
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Sandia National Laboratories, SUMMiT™ Technologies
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