FE SEM - Field Emission Scanning Electron Microscope

Field emission scanning electron microscopes (FESEM) deliver ultra-high resolutions down to 1 nm for the most demanding electron microscope applications. The ultra-high resolution FESEMs operate over the complete voltage range with probe currents up to 20 nA and are available with variable chamber pressure technology.

FE-SEM Manufacturers

The new Mira series of field emission scanning electron microscopes uses a high brightness Schottky-emitter for high-resolution / high-current / low-noise imaging. Contact Tescan USA

The SUPRA™ series of GEMINI® column ultra high resolution FESEMs offer superb resolution, high efficiency In-lens SE detector, and low magnetic fields at specimen level. Contact Zeiss

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