Atomic Force, Scanning Probe, and Scanning Tunneling Microscopes

Modular, user-friendly Atomic Force Microscopes designed specifically for Materials Research, Nanotechnology, and
Life Science. Features:

1. Integrated scientific-grade optical microscope for
   superior optical access, easy cantilever alignment, and high resolution sample survey,
2. Support of all standard AFM modes, ensuring high flexibility throughout the full range of AFM applications,
3. Upgradable to Confocal Microscopy and Confocal Raman Microscopy, and Scanning Near-field Optical Microscopy (SNOM),
4. Pulsed Force Mode for investigating local surface properties along with topographic structures on the nanometer scale.

Please contact WITec.

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